Browse Qian, Jiashu; Shi, Limeng; Jin, Michael; Bhattacharya, Monikuntala; Shimbori, Atsushi; Yu, Hengyu; H

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Title	Type	Date	Words
Modeling of Charge-to-Breakdown with an Electron Trapping Model for Analysis of Thermal Gate Oxide Failure Mechanism in SiC Power MOSFETs.		Apr 1, 2024	6964

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